Intel

Intel Corporation

45 articles

Semiconductor Engineering

AFM-Based Protocol for Characterizing the Incipient Stages of Plasticity on Hybrid Bonding-Ready Copper Pads (NIST, Intel, Colorado School of Mines)

Dec 23, 2025

A new technical paper discusses the use of multimodal atomic force microscopy to investigate the early stages of plasticity in electroplated copper, which is crucial for hybrid bonding applications. This research is a collaboration between the National Institute of Standards and Technology, Intel, and Colorado School of Mines.

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